Volume 11 Issue 6 - November 20, 2009 PDF
Counter
Articles Digest

Research Express@NCKU Nov. 20 ~ Nov. 26, 2009

RSS

Approximate Sample size formula for Testing Group Mean Differences when Variances are Unequal in One-way ANOVA
Wei-ming Luh

This paper is published in Educational and Psychological Measurement (Impact factor 0.831, ranked 19 out of 38 Educational Psychology Journals in 2007 JCR). The one-way fixed-effect ANOVA is one of the most common statistical methods used in scientific research. Because of the adverse consequences of insufficient sample size, a more practical sample size calculation is worth developing in …

Read More ...
In-situ re-activated catalyst for unprecedented re-growth of carbon nanotubes
Jyh-Ming Ting

Abstract
We report a simple stepped growth process for the synthesis of carbon nanotubes (CNTs) having excellent field emission properties.  CNT growth was interrupted in the process. During the interruption, the catalyst was re-activated in-situ.  This resulted in enhanced growth of the CNTs after the interruption and a film of CNTs re-grew on top of an existing CNT film at …

Read More ...
Amelioration of collagen-induced arthritis in rats by adenovirus-mediated PTEN gene transfer
Chao-Liang Wu

The phosphatidylinositol 3-kinase (PI3-kinase)/Akt pathway is known to be activated in rheumatoid arthritis (RA) synovial tissue, which impacts cell growth, proliferation, survival, and migration. Phosphatase and tensin homolog deleted from chromosome 10 (PTEN) functions as a negative regulator of PI 3-kinase signaling, thus blocking Akt activation. The aim of this study was to examine the effect …

Read More ...
Degeneration of CMOS Power Cells After Hot-Carrier and Load Mismatch Stresses
Yan-Kuin Su

Abstract
In this letter, we investigate the performance degradation of nMOS transistors due to hot-carrier effect and load impedance mismatch. The DC and RF characteristics, such as drain current, threshold voltage, transconductance, output power, and power-added efficiency etc., are affected under hot-carrier effect. With load impedance mismatch, the transistors experience the reflected …

Read More ...
Font Enlarge

Go to archive
Copyright National Cheng Kung University